A novel approach to pulsed laser deposition of platinum catalyst on carbon particles for use in polymer electrolyte membrane fuel cells

• Bogusław Budner,
• Wojciech Tokarz,
• Sławomir Dyjak,
• Andrzej Czerwiński,
• Bartosz Bartosewicz and
• Bartłomiej Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 190–204, doi:10.3762/bjnano.14.19

• morphology of the carbon material was examined using a scanning electron microscope (SEM) equipped with energy-dispersive spectroscopy (EDS). SEM measurements of the samples were carried out using a Quanta 3D FEG microscope (FEI, United States). The surface imaging and EDS measurements were done at an

An atomic force microscope integrated with a helium ion microscope for correlative nanoscale characterization

• Santiago H. Andany,
• Gregor Hlawacek,
• Stefan Hummel,
• Charlène Brillard,
• Mustafa Kangül and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2020, 11, 1272–1279, doi:10.3762/bjnano.11.111

• . For AFM and HIM, this is particularly advantageous since both can image non-conductive samples at very high resolution without charging. This is essential for correlative mechanical property and HIM surface imaging, and it is a clear advantage of AFM–HIM compared to AFM–SEM, where a conductive coating

Pull-off and friction forces of micropatterned elastomers on soft substrates: the effects of pattern length scale and stiffness

• Peter van Assenbergh,
• Marike Fokker,
• Julian Langowski,
• Jan van Esch,
• Marleen Kamperman and
• Dimitra Dodou

Beilstein J. Nanotechnol. 2019, 10, 79–94, doi:10.3762/bjnano.10.8

Scanning reflection ion microscopy in a helium ion microscope

• Yuri V. Petrov and
• Oleg F. Vyvenko

Beilstein J. Nanotechnol. 2015, 6, 1125–1137, doi:10.3762/bjnano.6.114

• detectable step height was found to be approximately 5 nm. RIM imaging of an insulator surface without the need for charge compensation was successfully demonstrated. Keywords: helium ion microscope; low-angle ion scattering; reflection microscopy; surface imaging; surface morphology; Introduction

Insect attachment on crystalline bioinspired wax surfaces formed by alkanes of varying chain lengths

• Elena Gorb,
• Sandro Böhm,
• Nadine Jacky,
• Louis-Philippe Maier,
• Kirstin Dening,
• Sasha Pechook,
• Boaz Pokroy and
• Stanislav Gorb

Beilstein J. Nanotechnol. 2014, 5, 1031–1041, doi:10.3762/bjnano.5.116

• evaporation, the specimens were kept at room temperature (25 °C). Surface imaging was performed by using SEM (FEI E-SEM Quanta 200, FEI Company, Hillsboro, OR, USA). Morphometrical variables of wax crystals (length CL and thickness CW) and density of crystals (CD) covering the surface of bioinspired wax

Dimer/tetramer motifs determine amphiphilic hydrazine fibril structures on graphite

• Loji K. Thomas,
• Nadine Diek,
• Uwe Beginn and
• Michael Reichling

Beilstein J. Nanotechnol. 2012, 3, 658–666, doi:10.3762/bjnano.3.75

• plane of HOPG to form a meniscus between the tip and the surface. Imaging was performed at the solution–solid interface where typical operating conditions were Vt = 1.3 V tunnelling voltage and It = 0.60 nA tunnelling current for the molecule and 0.05 V at 1.00 nA for imaging the bare graphite substrate

Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM

• Fabien Castanié,
• Laurent Nony,
• Sébastien Gauthier and
• Xavier Bouju

Beilstein J. Nanotechnol. 2012, 3, 301–311, doi:10.3762/bjnano.3.34

• , germanium, etc). Recent improvements of this potential [103] do not modify the results presented below. In the case of graphite, the van der Waals interaction between two layers is described by a standard Lennard-Jones potential: with ε = 0.011 eV and σ = 3.2963 Å. Results and Discussion Graphite surface

• imaging AFM imaging of the graphite surface is a difficult task because the interaction between the tip and the sample is generally weak. Following Hembacher et al. [41], the normalized frequency shift γ = kA3/2Δf/f0 is estimated to be |γ| < 1 fN·m1/2. With the parameters used with the n-AFM, one gets γ